日本理学 RIGAKU Ultima II用途：为多功能 X 射线衍射仪，适用于材料科学、化工、地质等领域，用于物相分析、晶体结构研究、织构分析，支持多种形态样品检测。技术原理：基于 X 射线衍射原理，X 射线照射样品产生衍射信号，通过测角仪控制角度，探测器采集衍射强度数据，经分析获取材料微观结构信息。性能：测角仪精度 ±0.0001°；扫描速度 0.01°-60°/min 可调；配备 12kW 旋转阳极 X 射线源；支持常温及高低温测试，数据稳定性高。

Product Name: RIGAKU Ultima IIPurpose: It is a multi-functional X-ray diffractometer, suitable for materials science, chemical industry, geology and other fields. It is used for phase analysis, crystal structure research, texture analysis, supporting detection of samples in various forms.Technical Principle: Based on the principle of X-ray diffraction, X-rays irradiate samples to generate diffraction signals. The goniometer controls the angle, and the detector collects diffraction intensity data. Material microstructure information is obtained through analysis.Performance: Goniometer accuracy ±0.0001°; scanning speed adjustable from 0.01°-60°/min; equipped with 12kW rotating anode X-ray source; supports room temperature, high and low temperature testing, with high data stability.