日本理学 RIGAKU Ultima III用途：为多功能 X 射线衍射仪，适用于材料科学、地质、制药等领域，用于物相分析、晶体结构测定、织构与应力分析，支持粉末及块状样品研究。技术原理：基于 X 射线衍射原理，X 射线照射样品产生衍射信号，通过测角仪精确控制角度，探测器采集衍射强度数据，经分析获取材料微观结构信息。性能：测角仪精度 ±0.0001°；扫描速度 0.01°-80°/min 可调；配备 18kW 旋转阳极 X 射线源；支持高低温测试，数据重现性好。

Product Name: RIGAKU Ultima IIIPurpose: It is a multi-functional X-ray diffractometer, suitable for materials science, geology, pharmaceutical and other fields. It is used for phase analysis, crystal structure determination, texture and stress analysis, supporting research on powder and bulk samples.Technical Principle: Based on the principle of X-ray diffraction, X-rays irradiate samples to generate diffraction signals. The goniometer precisely controls the angle, and the detector collects diffraction intensity data. Material microstructure information is obtained through analysis.Performance: Goniometer accuracy ±0.0001°; scanning speed adjustable from 0.01°-80°/min; equipped with 18kW rotating anode X-ray source; supports high and low temperature testing, with good data reproducibility.