是德科技 KEYSIGHT 5DX (5300) Series 5000 X 射线检测系统用途：适用于电子制造高密度生产线，对多层 PCB 组件、先进半导体封装进行高精度检测，可识别微米级焊点缺陷、3D 堆叠结构异常及微型元件偏移，满足高端电子设备的质量管控需求。技术原理：采用高功率 X 射线源与多维度成像技术，结合动态断层扫描算法，通过材料对 X 射线的吸收差异生成分辨率断层图像，消除层间干扰，实现内部微观结构的精准分析。性能：配备 150kV 微焦点 X 射线管，焦点尺寸 3μm，空间分辨率＜0.8μm。采用 500 万像素探测器，检测速度达 400mm/s。最大样品尺寸 600×500mm，支持 75° 倾斜与 360° 旋转，具备深度学习缺陷识别功能，误报率＜0.3%。

Product Name: Keysight KEYSIGHT 5DX (5300) Series 5000 X-ray Inspection SystemUsage: Suitable for high-density electronics production lines, conducting high-precision inspection of multi-layer PCB assemblies and advanced semiconductor packages. It identifies micron-level solder defects, 3D stacked structure abnormalities and micro-component shifts, meeting quality control needs of high-end electronic devices.Technical Principle: Adopts high-power X-ray source and multi-dimensional imaging technology, combined with dynamic tomography algorithms. Generates high-resolution tomographic images based on material absorption differences of X-rays, eliminating interlayer interference for accurate analysis of internal microstructures.Performance: Equipped with 150kV micro-focus X-ray tube, focal spot size 3μm, spatial resolution ＜0.8μm. Uses 5-megapixel detector, inspection speed up to 400mm/s. Maximum sample size 600×500mm, supports 75° tilt and 360° rotation, with deep learning defect recognition, false alarm rate ＜0.3%.