菲希尔 FISCHER XDVM X 射线荧光镀层测厚仪用途：适用于电子元件、精密五金等领域，对复杂形状工件的多层镀层进行厚度与成分分析，可检测金、银、铜等镀层，满足高精度工艺的质量监控需求。技术原理：通过微焦点 X 射线激发镀层，利用特征荧光的能量与强度差异，结合三维建模算法，实现曲面及异形表面的精准测量，同时分析元素组成。性能：测量范围 0.003μm-800μm，分辨率 0.0005μm。支持 10 层以内镀层分析，元素检测覆盖铝（Al）至铀（U）。配备高灵敏度探测器，测量时间 0.3-30 秒，样品台可适配 Φ120mm 工件，具备自动对焦功能。

Product Name: Fischer FISCHER XDVM X-ray Fluorescence Coating Thickness GaugeUsage: Suitable for electronic components, precision hardware and other fields, conducting thickness and composition analysis of multi-layer coatings on complex-shaped workpieces. It can detect gold, silver, copper coatings, meeting quality monitoring needs of high-precision processes.Technical Principle: Excites coatings with micro-focus X-rays, uses energy and intensity differences of characteristic fluorescence, combined with 3D modeling algorithms to achieve precise measurement of curved and irregular surfaces, while analyzing element composition.Performance: Measurement range 0.003μm-800μm, resolution 0.0005μm. Supports analysis of up to 10 layers, element detection covers Al to U. Equipped with high-sensitivity detector, measurement time 0.3-30s, sample stage adapts to Φ120mm workpieces, with auto-focus function.