牛津 OXFORD maXXi 6 台式微聚焦 XRF 镀层测厚仪用途：基于 X 射线荧光（XRF）技术，用于镀层厚度测量和材料分析，可对从铝（Al13）到铀（U92）广泛元素范围内的固体或液体进行分析，适用于电镀行业、印刷电路板生产等众多工业领域的质量控制。技术原理：利用 X 射线荧光技术，仪器的微聚焦铍窗 X 射线管发射 X 射线，照射到样品上，样品中的元素受激发产生特征 X 射线荧光，被高分辨率硅漂移探测器（SDD）检测，从而分析样品的镀层厚度和元素组成。性能：拥有高分辨率硅漂移探测器，可测量低至纳米级的最薄涂层和痕量元素组成。配备 8 个可更换准直器，能量分辨率高达 140 eV ，在所有能量水平下都具有最佳效率。大尺寸开槽样品腔内部容积为 500mm x 450mm x 170mm，适用于各种标准和超大尺寸样品。可编程样品台可实现自动测量，最大化台面行程范围和速度。经德国物理技术研究院（PTB）批准，具备最高级别的辐射安全保障。

Product Name: Oxford OXFORD maXXi 6 Benchtop Microfocus XRF Coating Thickness GaugeUsage: Based on X - ray fluorescence (XRF) technology, it is used for coating thickness measurement and materials analysis. It can analyze solids or liquids within a wide element range from aluminum (Al13) to uranium (U92), and is suitable for quality control in many industrial fields such as the plating industry and printed circuit board production.Technical Principle: Using X - ray fluorescence technology, the micro - focus beryllium - window X - ray tube of the instrument emits X - rays, which irradiate the sample. The elements in the sample are excited to generate characteristic X - ray fluorescence, which is detected by a high - resolution silicon drift detector (SDD) to analyze the coating thickness and elemental composition of the sample.Performance: Equipped with a high - resolution silicon drift detector, it can measure the thinnest coatings down to the nanoscale and the elemental composition at trace levels. It has eight exchangeable collimators, with an energy resolution of up to 140 eV, providing optimal efficiency at all energy levels. The large slotted sample chamber has an internal volume of 500mm x 450mm x 170mm, suitable for a wide variety of standard and oversized samples. The programmable sample stage enables automated measurement, maximizing the table travel range and speed. Approved by the Physikalisch - Technische Bundesanstalt (PTB) in Germany, it ensures the highest level of radiation safety.