STOE Stadi MP用途：适用于材料科学、化学、地质学等领域，可进行粉末 X 射线衍射分析，用于物相鉴定、晶体结构测定、定量分析等，助力材料研究与质量控制。技术原理：基于 X 射线衍射（XRD）技术，X 射线照射样品后，与晶体中的原子相互作用产生衍射。不同晶体的原子排列对应特定衍射角和强度，仪器通过测量这些数据确定晶体结构和物相。性能：配备高精度测角仪，角度重现性达 ±0.0001°；采用高分辨率探测器，可分辨细微衍射峰；支持多种样品形态分析，分析速度快；软件功能全面，可实现自动数据采集与解析，提升分析效率。

Product Name: STOE Stadi MPPurpose: Suitable for materials science, chemistry, geology and other fields. It can perform powder X-ray diffraction analysis for phase identification, crystal structure determination, quantitative analysis, etc., aiding material research and quality control.Technical Principle: Based on X-ray diffraction (XRD) technology, after X-rays irradiate the sample, they interact with atoms in the crystal to produce diffraction. The atomic arrangement of different crystals corresponds to specific diffraction angles and intensities. The instrument determines the crystal structure and phase by measuring these data.Performance: Equipped with a high-precision goniometer with an angle reproducibility of ±0.0001°; adopts a high-resolution detector that can distinguish subtle diffraction peaks; supports analysis of various sample forms with fast analysis speed; comprehensive software functions enable automatic data collection and analysis, improving analysis efficiency.