尼康 NIKON 225CT X 射线计算机断层扫描系统用途：适用于多行业，如电子制造中对 PCB 组件、半导体元件检测；医疗领域对小型医疗器械检测；汽车与航空航天业对精密零部件检测。能精准检测内部结构缺陷、尺寸偏差，助力质量控制、失效分析与研发优化。技术原理：采用尼康自研微焦点 X 射线源，225kV 高电压配合独特旋转靶技术（如 “Rotating Target 2.0”），实现高效散热与更小焦点尺寸，发射 X 射线穿透物体。探测器接收不同强度 X 射线并转化为电信号，经计算机重建算法生成物体断层图像，呈现内部细节。性能：焦点尺寸小，成像清晰。几何放大与系统放大倍率适配不同精度需求。配备高分辨率探测器（如 400 万像素级别），确保图像质量。检测区域灵活，可测不同尺寸样品，最大能测一定规格大型样品。具备快速扫描与图像重建功能，使用优化显卡，处理时间从小时级缩至分钟级。温度控制外壳保障系统稳定性，测量精度可达微米级，符合 VDI/VDE 2630 标准 。

Product Name: Nikon NIKON 225CT X - ray Computed Tomography SystemUsage: Applicable to multiple industries. In electronics manufacturing, it can be used for the inspection of PCB assemblies and semiconductor components; in the medical field, for the inspection of small medical devices; in the automotive and aerospace industries, for the inspection of precision parts. It can accurately detect internal structural defects and dimensional deviations, facilitating quality control, failure analysis, and research and development optimization.Technical Principle: It adopts Nikon's self - developed micro - focus X - ray source. The 225 kV high voltage, combined with the unique rotating target technology (such as "Rotating Target 2.0"), enables efficient heat dissipation and a smaller focal spot size to emit X - rays to penetrate the object. The detector receives X - rays of different intensities and converts them into electrical signals. Through computer reconstruction algorithms, tomographic images of the object are generated to present internal details.Performance: The focal spot size is small, ensuring clear imaging. The geometric magnification and system magnification are adaptable to different accuracy requirements. It is equipped with a high - resolution detector (such as at the 4 - megapixel level) to ensure image quality. The detection area is flexible, capable of measuring samples of different sizes, and can measure large - sized samples up to a certain specification. It has fast scanning and image reconstruction functions. Using an optimized graphics card, the processing time is reduced from hours to minutes. The temperature - controlled enclosure ensures system stability, and the measurement accuracy can reach the micron level, meeting the VDI/VDE 2630 standard.