诺信 NORDSON XD 6500 XiDat X 射线检测系统用途：适用于电子制造领域，对印刷电路板（PCB）组件、小型半导体封装等进行无损检测，可识别焊点缺陷、元件内部异常及位置偏移，助力质量控制与生产效率提升。技术原理：发射 X 射线穿透物体，因材料对 X 射线吸收差异形成不同强度分布，探测器接收后转化为电信号，经处理生成图像，实现内部状况分析。性能：配备 90kV X 射线管，特征分辨率＜2μm。采用 80 万像素 CMOS 探测器，6 帧 / 秒实时成像。几何放大 800 倍，系统放大 2400 倍。最大样品尺寸 457×356mm，支持 55° 倾斜与 360° 旋转检测，操作简便。

Product Name: Nordson NORDSON XD 6500 XiDat X-ray Inspection SystemUsage: Suitable for electronics manufacturing, used for non-destructive inspection of PCB assemblies and small semiconductor packages. It identifies solder defects, internal component abnormalities and position shifts, aiding quality control and production efficiency improvement.Technical Principle: Emits X-rays to penetrate objects. Due to different X-ray absorption by materials, varying intensity distributions form. Detectors receive and convert to electrical signals, processed into images for internal condition analysis.Performance: Equipped with 90kV X-ray tube, feature resolution ＜2μm. Uses 0.8-megapixel CMOS detector, 6fps real-time imaging. Geometric magnification 800x, system magnification 2400x. Maximum sample size 457×356mm, supports 55° tilt and 360° rotation inspection, easy to operate.