日本理学 RIGAKU TTRAX III用途：为多功能 X 射线衍射仪，适用于材料科学、化工、制药等领域，用于物相分析、织构测定、应力分析及薄膜表征，助力材料结构研究与质量控制。技术原理：基于 X 射线衍射原理，X 射线照射样品产生衍射信号，通过测角仪精确控制角度，探测器采集衍射强度数据，经分析获得材料晶体结构信息。性能：测角仪精度 ±0.0001°；扫描速度 0.01°-100°/min 可调；配备 18kW 旋转阳极 X 射线源；支持多种样品台，兼容粉末、薄膜、块状样品，数据重现性好。

Product Name: RIGAKU TTRAX IIIPurpose: It is a multi-functional X-ray diffractometer, suitable for materials science, chemical industry, pharmaceutical and other fields. It is used for phase analysis, texture measurement, stress analysis and thin film characterization, aiding material structure research and quality control.Technical Principle: Based on the principle of X-ray diffraction, X-rays irradiate samples to generate diffraction signals. The goniometer precisely controls the angle, and the detector collects diffraction intensity data. Material crystal structure information is obtained through analysis.Performance: Goniometer accuracy ±0.0001°; scanning speed adjustable from 0.01°-100°/min; equipped with 18kW rotating anode X-ray source; supports multiple sample stages, compatible with powder, thin film and bulk samples, with good data reproducibility.