菲希尔 FISCHER XDLM 237 X 射线荧光镀层测厚仪用途：适用于精密电子、航空航天等领域，对多层金属镀层及复合涂层进行厚度与成分检测，可分析镍、铬、金等镀层，满足高精密产品的质量验证需求。技术原理：X 射线管发射初级 X 射线激发镀层，元素释放特征荧光，探测器接收后通过能量色散区分元素，结合预设校准模型计算镀层厚度与成分占比。性能：测量范围 0.005μm-1000μm，分辨率 0.001μm。支持最多 8 层镀层分析，元素检测覆盖钛（Ti）至铀（U）。配备低噪声探测器，测量时间 0.5-60 秒，样品台尺寸 100×100mm，具备温度补偿功能。

Product Name: Fischer FISCHER XDLM 237 X-ray Fluorescence Coating Thickness GaugeUsage: Suitable for precision electronics, aerospace and other fields, conducting thickness and composition detection of multi-layer metal coatings and composite layers. It can analyze nickel, chromium, gold coatings, meeting quality verification needs of high-precision products.Technical Principle: X-ray tube emits primary X-rays to excite coatings. Elements release characteristic fluorescence. Detector receives and distinguishes elements via energy dispersion, calculates coating thickness and composition ratio with preset calibration models.Performance: Measurement range 0.005μm-1000μm, resolution 0.001μm. Supports up to 8-layer coating analysis, element detection covers Ti to U. Equipped with low-noise detector, measurement time 0.5-60s, sample stage size 100×100mm, with temperature compensation function.