布鲁克 BRUKER D5000 X 射线衍射仪用途：适用于材料科学、化工领域，对晶体材料进行物相分析、结构测定及晶粒尺寸计算，可分析粉末、薄膜等样品，满足材料结构表征与性能研究需求。技术原理：通过 Cu 靶 X 射线源发射特征 X 射线，照射样品后发生衍射，探测器接收衍射信号，依据布拉格定律计算晶面间距，解析晶体结构与物相组成。性能：衍射角范围 1°-160°，分辨率 0.01°。配备 θ-θ 测角仪，扫描速度 0.01-10°/min。样品台尺寸 Φ50mm，支持高低温附件（-196℃至 1000℃），数据采集时间短至 5 分钟。

Product Name: Bruker BRUKER D5000 X-ray DiffractometerUsage: Suitable for materials science and chemical engineering, conducting phase analysis, structure determination and grain size calculation of crystalline materials. It can analyze powders, thin films, meeting needs for material structure characterization and performance research.Technical Principle: Emits characteristic X-rays via Cu target X-ray source, which diffract after irradiating samples. Detector receives diffraction signals, calculates interplanar spacing based on Bragg's law, and analyzes crystal structure and phase composition.Performance: Diffraction angle range 1°-160°, resolution 0.01°. Equipped with θ-θ goniometer, scanning speed 0.01-10°/min. Sample stage size Φ50mm, supports high-low temperature accessories (-196℃ to 1000℃), data collection time as short as 5 minutes.