日本电子 JEOL JSX - 3202EV 能量分散形荧光 X 射线元素分析仪。用途：针对 ROHS 指令研发，用于检测塑胶、金属等样品中 Cd、Pb、Cr、Br、Hg 等有害元素含量，以判断样品是否符合相关法规，广泛应用于电子、包装等行业。技术原理：采用 X 射线荧光光谱分析技术，X 射线源发出的射线照射样品，样品中元素受激发产生特征 X 射线，探测器根据特征 X 射线的能量和强度来确定元素种类和含量。性能：搭载新光学系（专利申请中）、高性能 X 射线源和高分辨率探测器，可检测数 ppm 级有害物质，如对塑料中微量 Cd 分析，感度达 5ppm，标准样品检测下限为 2ppm。高计数回路可实现 100kcps 测量，分析速度快，如 40ppm Cd 样品 10 秒、10ppm Cd 样品 2 分钟即可完成分析。

Product Name: JEOL JSX - 3202EV Energy - Dispersive X - Ray Fluorescence Element Analyzer.Purpose: Developed for the ROHS directive, it is used to detect the contents of harmful elements such as Cd, Pb, Cr, Br and Hg in samples like plastics and metals, so as to judge whether the samples comply with relevant regulations. It is widely used in industries such as electronics and packaging.Technical Principle: It adopts X - ray fluorescence spectroscopy technology. The X - ray source irradiates the sample with rays, and the elements in the sample are excited to produce characteristic X - rays. The detector determines the element type and content based on the energy and intensity of the characteristic X - rays.Performance: Equipped with a new optical system (patent applied for), a high - performance X - ray source and a high - resolution detector, it can detect harmful substances at the ppm level. For example, in the analysis of trace Cd in plastics, the sensitivity can reach 5 ppm, and the detection limit of standard samples is 2 ppm. The high - count circuit can achieve 100 kcps measurement, and the analysis speed is fast. For example, a 40 - ppm Cd sample can be analyzed in 10 seconds, and a 10 - ppm Cd sample can be analyzed in 2 minutes.