马尔文 PANALYTICAL Xpert³ Powder用途：适用于高通量、高品质的物相鉴定和定量分析、残余应力分析、掠入射衍射、X 射线反射、小角度 X 射线散射、对分布函数分析及非常温环境衍射。技术原理：X 射线发生模块产生 X 射线照射样品，X 射线被样品相衍射并进入探测器，通过移动样品和探测器改变衍射角，测量强度并记录衍射数据。性能：配备先进电控系统，符合严格 X 射线安全规范。搭配 X’Celerator 探测器，XRD 测量速度可比传统点探测器快 100 倍，且无需冷却水、液氮、计数气体或耗时校准；PIXcel^{1D} 探测器用于 0D 和 1D 应用，测量速度比传统点探测器快 255 倍 。

Product Name: Malvern PANALYTICAL Xpert³ PowderUsage: Suitable for high - throughput and high - quality phase identification and quantitative analysis, residual stress analysis, grazing incidence diffraction, X - ray reflection, small - angle X - ray scattering, pair distribution function analysis, and diffraction in non - ambient environments.Technical Principle: The X - ray generation module generates X - rays to irradiate the sample. The X - rays are diffracted by the sample and enter the detector. By moving the sample and the detector, the diffraction angle is changed, the intensity is measured, and the diffraction data is recorded.Performance: Equipped with an advanced electrical control system, it complies with strict X - ray safety regulations. When equipped with the X’Celerator detector, XRD measurement speed can be 100 times faster than that of traditional point detectors, and there is no need for cooling water, liquid nitrogen, counting gas, or time - consuming calibration. The PIXcel^{1D} detector is used for 0D and 1D applications, and the measurement speed is 255 times faster than that of traditional point detectors.