布鲁克 BRUKER NANOSTAR 小角 X 射线散射仪用途：适用于纳米材料、生物大分子领域，对纳米颗粒、薄膜及聚合物的结构进行表征，可分析尺寸分布、孔隙结构，满足纳米尺度结构研究需求。技术原理：通过聚焦 X 射线照射样品，纳米结构引发小角度散射，探测器捕捉散射信号，结合散射理论计算纳米颗粒尺寸、分布及界面信息，实现微观结构解析。性能：散射角范围 0.05°-30°，空间分辨率 1μm。配备 Cu 靶 X 射线源，光束尺寸 50μm，检测限低至 1nm。样品台支持温度控制（-150℃至 300℃），数据采集时间 5-60 分钟。

Product Name: Bruker BRUKER NANOSTAR Small-Angle X-ray Scattering SystemUsage: Suitable for nanomaterials and biological macromolecules, characterizing structures of nanoparticles, thin films and polymers. It can analyze size distribution and pore structure, meeting needs for nanoscale structure research.Technical Principle: Irradiates samples with focused X-rays, nanoscale structures cause small-angle scattering. Detector captures scattering signals, calculates nanoparticle size, distribution and interface information based on scattering theory to realize microstructural analysis.Performance: Scattering angle range 0.05°-30°, spatial resolution 1μm. Equipped with Cu target X-ray source, beam size 50μm, detection limit as low as 1nm. Sample stage supports temperature control (-150℃ to 300℃), data collection time 5-60 minutes.