日本理学 RIGAKU Ultima IV用途：为多功能 X 射线衍射仪，适用于材料科学、化工、制药等领域，用于物相分析、晶体结构测定、织构与应力分析及薄膜表征，支持多类型材料研究。技术原理：基于 X 射线衍射原理，X 射线照射样品产生衍射信号，通过高精度测角系统控制角度，探测器采集衍射强度数据，经分析获得材料微观结构信息。性能：测角仪精度 ±0.0001°；扫描速度 0.01°-100°/min 可调；配备 18kW 旋转阳极 X 射线源；支持高低温附件，兼容粉末、薄膜、块状样品，数据重现性优异。

Product Name: RIGAKU Ultima IVPurpose: It is a multi-functional X-ray diffractometer, suitable for materials science, chemical industry, pharmaceutical and other fields. It is used for phase analysis, crystal structure determination, texture and stress analysis, and thin film characterization, supporting multi-type material research.Technical Principle: Based on the principle of X-ray diffraction, X-rays irradiate samples to generate diffraction signals. The high-precision goniometer system controls the angle, and the detector collects diffraction intensity data. The microstructure information of materials is obtained through analysis.Performance: Goniometer accuracy ±0.0001°; scanning speed adjustable from 0.01°-100°/min; equipped with 18kW rotating anode X-ray source; supports high and low temperature accessories, compatible with powder, thin film and bulk samples, with excellent data reproducibility.