菲希尔 FISCHER XRF-4200 X 射线荧光光谱仪用途：适用于金属、矿石、塑料等材料的元素分析与镀层检测，可测定元素成分及镀层厚度，广泛应用于制造业、地质勘探、环保等领域，满足快速筛查与精准分析需求。技术原理：利用 X 射线激发样品产生特征荧光，通过探测器捕捉荧光能量与强度，结合光谱分析算法识别元素种类并计算含量或镀层厚度，实现无损检测。性能：分析元素范围从钠（Na）到铀（U），镀层测量范围 0.01μm-2000μm，分辨率 0.001μm。配备 50kV X 射线管，能量分辨率≤150eV（Mn Kα），检测时间 1-100 秒，样品台尺寸 Φ100mm，支持多模式校准。

Product Name: Fischer FISCHER XRF-4200 X-ray Fluorescence SpectrometerUsage: Suitable for elemental analysis and coating detection of metals, ores, plastics and other materials. It can determine elemental composition and coating thickness, widely used in manufacturing, geological exploration, environmental protection, meeting needs for rapid screening and precise analysis.Technical Principle: Excites samples with X-rays to generate characteristic fluorescence. Detector captures fluorescence energy and intensity, and combines spectral analysis algorithms to identify element types and calculate content or coating thickness for non-destructive testing.Performance: Analysis range covers Na to U, coating measurement range 0.01μm-2000μm, resolution 0.001μm. Equipped with 50kV X-ray tube, energy resolution ≤150eV (Mn Kα), detection time 1-100s, sample stage size Φ100mm, supports multi-mode calibration.