菲希尔 FISCHER XDL X 射线荧光镀层测厚仪用途：适用于工业镀层检测，可对金属基材上的单层及多层镀层进行厚度分析，覆盖五金、汽车零部件等领域，满足批量生产中的快速质量核查需求。技术原理：X 射线激发镀层产生特征荧光，依据荧光强度与厚度的定量关系，通过内置校准曲线计算镀层厚度，实现非接触式无损测量。性能：测量范围 0.01μm-1000μm，分辨率 0.001μm。支持 3 层以内镀层分析，元素检测范围从镁（Mg）到铅（Pb）。配备小型化探测器，测量时间 1-50 秒，样品台尺寸 Φ60mm，操作界面支持一键测量。

Product Name: Fischer FISCHER XDL X-ray Fluorescence Coating Thickness GaugeUsage: Suitable for industrial coating inspection, capable of thickness analysis of single and multi-layer coatings on metal substrates. Covers hardware, auto parts and other fields, meeting rapid quality verification needs in mass production.Technical Principle: X-rays excite coatings to generate characteristic fluorescence. Calculates coating thickness via built-in calibration curves based on the quantitative relationship between fluorescence intensity and thickness, enabling non-contact non-destructive measurement.Performance: Measurement range 0.01μm-1000μm, resolution 0.001μm. Supports analysis of up to 3 layers, element detection range from Mg to Pb. Equipped with miniaturized detector, measurement time 1-50s, sample stage size Φ60mm, operation interface supports one-key measurement.