布鲁克 BRUKER D8 X 射线衍射仪用途：适用于材料科学、化学、地质、药物等领域，可对多晶材料、粉末、薄膜样品进行物相分析、晶胞参数测定、晶粒度与结晶度计算，满足材料微观结构表征与性能研究需求。技术原理：以 X 射线源发射 X 射线，照射样品后产生衍射现象。依据布拉格定律，通过探测器接收衍射信号，计算晶面间距，从而解析晶体结构，实现对样品的分析。性能：X 射线源如采用 Cu 靶陶瓷光管，功率可达 2.2kW 。测角仪 2θ 转动范围广，可达 - 10° 至 168°，可读最小步长 0.0001° ，角度重现性达 0.0001°。探测器类型多样，如能量色散阵列检测器，最大计数≥1×10⁹cps，线性范围≥4×10⁷cps ，背景＜0.1cps ，具备零维、一维和二维测量模式。部分型号配备原位变温附件，测试温区可达室温至 1600℃，控温精度 ±0.1℃ 。

Product Name: Bruker BRUKER D8 X-ray DiffractometerUsage: Suitable for fields such as materials science, chemistry, geology, and pharmaceuticals. It can perform phase analysis, unit cell parameter determination, grain size and crystallinity calculation on polycrystalline materials, powders, and thin film samples, meeting the needs of material microstructure characterization and performance research.Technical Principle: An X-ray source emits X-rays, which diffract when irradiated onto the sample. Based on Bragg's law, the detector receives the diffraction signals to calculate the interplanar spacing, thereby analyzing the crystal structure and realizing the analysis of the sample.Performance: The X-ray source, such as a Cu target ceramic X-ray tube, can reach a power of 2.2kW. The goniometer has a wide 2θ rotation range, from -10° to 168°, with a minimum readable step of 0.0001° and an angular reproducibility of 0.0001°. There are various types of detectors. For example, the energy-dispersive array detector has a maximum count of ≥1×10⁹cps, a linear range of ≥4×10⁷cps, a background of <0.1cps, and has zero-dimensional, one-dimensional, and two-dimensional measurement modes. Some models are equipped with in-situ temperature-changing accessories, with a test temperature range from room temperature to 1600°C and a temperature control accuracy of ±0.1°C.