菲希尔 FISCHERSCOPE X - RAY XDV - M - SD用途：主要用于精确测量极薄涂层厚度以及进行精细材料分析，适用于电子、半导体、光伏等行业，可检测如电子元件上的金、钯等薄涂层，也能分析多层系统，还可用于有害物质痕量分析等lastek.com.au。技术原理：基于 X 射线荧光光谱分析技术，X 射线源发出射线照射样品，使样品内元素受激发产生特征 X 射线，探测器依据特征 X 射线的能量和强度确定元素种类与含量，结合数字脉冲处理器 DPP + ，提升测量性能helmutfischer.com.cn。性能：配备超大有效面积 50mm² 的高性能硅漂移探测器，可精确无损测量薄至 2nm 的涂层。能分析从铝（13）到铀（92）的元素，可编程 XY 工作台定位精度小于 5µm，测量距离可通过 DCM 方法快速简便调整，还有可更换的准直器和滤镜，以优化测量条件Helmut Fischer。

Product Name: Fischer FISCHERSCOPE X - RAY XDV - M - SDPurpose: It is mainly used for accurately measuring the thickness of extremely thin coatings and conducting fine material analysis. It is suitable for industries such as electronics, semiconductors, and photovoltaics. It can detect thin coatings such as gold and palladium on electronic components, analyze multilayer systems, and also be used for trace analysis of harmful substances.Technical Principle: Based on X - ray fluorescence spectroscopy technology, the X - ray source emits rays to irradiate the sample, causing the elements in the sample to be excited to produce characteristic X - rays. The detector determines the element type and content according to the energy and intensity of the characteristic X - rays. Combined with the digital pulse processor DPP +, the measurement performance is improved.Performance: Equipped with a high - performance silicon drift detector with an extra - large effective area of 50mm², it can accurately and non - destructively measure coatings as thin as 2nm. It can analyze elements from aluminum (13) to uranium (92). The programmable XY stage has a positioning accuracy of less than 5µm. The measuring distance can be quickly and easily adjusted by the DCM method. There are also exchangeable collimators and filters to optimize the measurement conditions.