日本理学 RIGAKU MiniFlex II用途：为台式 X 射线衍射仪，适用于教学、科研、工业质检等领域，用于物相鉴定、结晶度测定及晶体结构分析，支持粉末、薄膜等样品检测。技术原理：基于 X 射线衍射原理，X 射线照射样品产生衍射信号，通过测角仪控制角度，探测器采集衍射强度数据，经分析获取材料晶体结构信息。性能：测角仪精度 ±0.02°；扫描速度 0.01°-40°/min 可调；配备 15W 微焦 X 射线管；体积紧凑，操作简便，单次分析时间≤15 分钟。

Product Name: RIGAKU MiniFlex IIPurpose: It is a benchtop X-ray diffractometer, suitable for teaching, scientific research, industrial quality inspection and other fields. It is used for phase identification, crystallinity determination and crystal structure analysis, supporting detection of powder, thin film and other samples.Technical Principle: Based on the principle of X-ray diffraction, X-rays irradiate samples to generate diffraction signals. The goniometer controls the angle, and the detector collects diffraction intensity data. Material crystal structure information is obtained through analysis.Performance: Goniometer accuracy ±0.02°; scanning speed adjustable from 0.01°-40°/min; equipped with a 15W microfocus X-ray tube; compact in size, easy to operate, single analysis time ≤15 minutes.