布鲁克 BRUKER D8 Endeavor X 射线衍射仪用途：适用于工业质量控制与科研领域，对金属、陶瓷、矿物等样品进行快速物相分析与结构验证，可检测原材料纯度及成品结晶状态，满足高效生产与研究需求。技术原理：通过稳定 X 射线源照射样品，利用晶体衍射特性生成衍射图谱，结合智能分析算法匹配标准数据库，实现物相识别与定量分析，操作流程自动化。性能：测角仪 2θ 范围 5°-160°，分辨率 0.01°。配备 Cu 靶 X 射线管，功率 2.2kW，扫描速度 0.1-20°/min。样品台支持 Φ50mm 样品，数据采集时间 3-10 分钟，具备自动进样功能。

Product Name: Bruker BRUKER D8 Endeavor X-ray DiffractometerUsage: Suitable for industrial quality control and scientific research, conducting rapid phase analysis and structure verification of metals, ceramics, minerals and other samples. It can detect raw material purity and finished product crystallization state, meeting needs for efficient production and research.Technical Principle: Irradiates samples with stable X-ray source, generates diffraction patterns using crystal diffraction properties, matches standard databases with intelligent analysis algorithms to realize phase identification and quantitative analysis, with automated operation 流程.Performance: Goniometer 2θ range 5°-160°, resolution 0.01°. Equipped with Cu target X-ray tube, power 2.2kW, scanning speed 0.1-20°/min. Sample stage supports Φ50mm samples, data collection time 3-10 minutes, with automatic sampling function.