菲希尔 FISCHER XDAL X 射线荧光镀层测厚仪用途：用于金属镀层、涂层的厚度及成分分析，适用于电子、汽车、五金等行业，可检测单层及多层镀层，满足质量管控与工艺优化需求。技术原理：通过 X 射线激发镀层产生特征荧光，依据荧光强度与镀层厚度的对应关系，结合校准曲线计算厚度，同时通过能量差异分析元素成分。性能：测量范围 0.01μm-500μm，分辨率 0.001μm。支持 1-5 层镀层分析，元素检测范围从铝（Al）到铀（U）。配备高分辨率探测器，测量时间 0.1-100 秒，样品台尺寸 Φ80mm，支持自动校准。

Product Name: Fischer FISCHER XDAL X-ray Fluorescence Coating Thickness GaugeUsage: Used for thickness and composition analysis of metal coatings and layers. Suitable for electronics, automotive, hardware industries, capable of detecting single and multi-layer coatings, meeting quality control and process optimization needs.Technical Principle: Excites coatings with X-rays to generate characteristic fluorescence. Calculates thickness based on the relationship between fluorescence intensity and coating thickness, combined with calibration curves. Analyzes elemental composition via energy differences.Performance: Measurement range 0.01μm-500μm, resolution 0.001μm. Supports 1-5 layer coating analysis, element detection range from Al to U. Equipped with high-resolution detector, measurement time 0.1-100s, sample stage size Φ80mm, supports automatic calibration.