日本理学 RIGAKU R-AXIS IV++用途：为 X 射线衍射面探测器系统，适用于蛋白质晶体学、小分子结构解析等领域，用于快速收集单晶衍射数据，助力三维晶体结构测定。技术原理：基于 X 射线衍射原理，X 射线照射单晶样品产生衍射斑点，面探测器捕捉全衍射图案，通过数据处理重构晶体原子排列信息。性能：探测器有效面积 200mm×200mm；空间分辨率 50μm；最大衍射角 160°；配备 2kW 微焦 X 射线源，数据采集时间短至几分钟，支持低温样品测量。

Product Name: RIGAKU R-AXIS IV++Purpose: It is an X-ray diffraction area detector system, suitable for protein crystallography, small molecule structure analysis and other fields. It is used for rapid collection of single crystal diffraction data, aiding three-dimensional crystal structure determination.Technical Principle: Based on the principle of X-ray diffraction, X-rays irradiate single crystal samples to generate diffraction spots. The area detector captures the full diffraction pattern, and reconstructs the atomic arrangement information of the crystal through data processing.Performance: Detector effective area 200mm×200mm; spatial resolution 50μm; maximum diffraction angle 160°; equipped with 2kW microfocus X-ray source, data collection time as short as a few minutes, supporting low-temperature sample measurement.