布鲁克 BRUKER AXS D8 Discover X 射线衍射仪用途：适用于材料科学、纳米技术领域，对薄膜、纳米材料及复杂样品进行结构分析，可测定晶体取向、应力分布及薄膜厚度，满足高精度材料表征需求。技术原理：采用微聚焦 X 射线源，结合高精度测角系统，通过探测 X 射线衍射信号，依据晶体衍射规律计算结构参数，实现对样品微观结构的三维解析。性能：X 射线源功率 1.8kW，最小光斑直径 50μm。测角仪精度 ±0.0001°，2θ 范围 - 110° 至 168°。支持掠入射模式，薄膜分析厚度低至 1nm，配备二维探测器，数据采集时间＜1 分钟。

Product Name: Bruker BRUKER AXS D8 Discover X-ray DiffractometerUsage: Suitable for materials science and nanotechnology, conducting structural analysis of thin films, nanomaterials and complex samples. It can determine crystal orientation, stress distribution and thin film thickness, meeting high-precision material characterization needs.Technical Principle: Uses micro-focus X-ray source combined with high-precision goniometer system, detects X-ray diffraction signals, calculates structural parameters based on crystal diffraction laws to realize 3D analysis of sample microstructure.Performance: X-ray source power 1.8kW, minimum spot diameter 50μm. Goniometer accuracy ±0.0001°, 2θ range -110° to 168°. Supports grazing incidence mode, thin film analysis thickness down to 1nm, equipped with 2D detector, data collection time ＜1 minute.