布鲁克 BRUKER D8 Advance X 射线衍射仪用途：适用于材料科学、化学、地质等领域，对多晶材料、薄膜及粉末样品进行物相分析、结构测定、晶粒度与结晶度计算，满足材料结构表征与性能研究需求。技术原理：以 Cu 靶陶瓷 X 光管发射 X 射线，照射样品后产生衍射，探测器接收信号，依据布拉格定律计算晶面间距，解析晶体结构，通过数字化处理增强衍射图谱特征。性能：最大输出功率 3kW，光管焦斑 0.4×12mm。测角仪半径≥200mm，2θ 转动范围 0.5°-120°，最小步长 0.0001°。探测器支持零维、一维、二维扫描，具备自动物相检索功能，可分析样品微区至 2mm 范围。

Product Name: Bruker BRUKER D8 Advance X-ray DiffractometerUsage: Suitable for materials science, chemistry, geology and other fields, conducting phase analysis, structure determination, grain size and crystallinity calculation of polycrystalline materials, thin films and powder samples, meeting needs for material structure characterization and performance research.Technical Principle: Emits X-rays with Cu target ceramic X-ray tube, which diffract after irradiating samples. Detector receives signals, calculates interplanar spacing based on Bragg's law to analyze crystal structure, and enhances diffraction pattern features via digital processing.Performance: Maximum output power 3kW, X-ray tube focal spot 0.4×12mm. Goniometer radius ≥200mm, 2θ rotation range 0.5°-120°, minimum step 0.0001°. Detector supports zero, one and two-dimensional scanning, with automatic phase search function, capable of analyzing sample micro-regions up to 2mm.