诺信 NORDSON XD7600NT X 射线检测系统用途：适用于电子制造领域的失效分析、PCB 板及电子元件组装检测等。能精准识别焊点缺陷、元件内部结构异常，助力提升产品质量与生产效率。技术原理：通过发射 X 射线穿透被检测物体，不同材料对 X 射线吸收程度不同，致使透过物体的 X 射线强度分布有别。探测器接收这些 X 射线，转化为电信号并处理生成图像，以此分析物体内部状况，实现无损检测。性能：配备 Nordson DAGE NT 免维护、封闭穿透式 X 光管，电压 30 - 160 kV，标靶功率小于 4W 时，特征识别达 <0.1μm（钻石款）或 < 0.5μm（红宝石款）；功率大于 4W 时，特征识别为 < 0.95μm；电压 110kV 以上，功率可达 10W。有 200 万像素（红宝石款）或 300 万像素（钻石款）CMOS 数字探测器，25 帧 / 秒实时成像。具备 2500 倍几何放大（钻石款）或 1800 倍（红宝石款），系统放大倍数更高，结合数字变焦，总放大倍数可观，如钻石款可达 35,500 倍 。可实现 70° 斜角视图，检测区域大，最大样品尺寸达 29”×22.8” (736×580 mm) 。

Product Name: Nordson NORDSON XD7600NT X - ray Inspection SystemUsage: It is suitable for failure analysis, PCB board and electronic component assembly inspection in the electronics manufacturing field. It can accurately identify solder joint defects and abnormal internal structures of components, helping to improve product quality and production efficiency.Technical Principle: By emitting X - rays to penetrate the object to be inspected, different materials have different absorption degrees of X - rays, resulting in different intensity distributions of X - rays passing through the object. The detector receives these X - rays, converts them into electrical signals, and processes them to generate an image, so as to analyze the internal condition of the object and achieve non - destructive testing.Performance: Equipped with Nordson DAGE NT maintenance - free, sealed transmissive X - ray tube, with a voltage of 30 - 160 kV. When the target power is less than 4W, the feature recognition reaches < 0.1μm (Diamond model) or < 0.5μm (Ruby model); when the power is greater than 4W, the feature recognition is < 0.95μm; when the voltage is above 110kV, the power can reach 10W. There are 2 - megapixel (Ruby model) or 3 - megapixel (Diamond model) CMOS digital detectors, with real - time imaging at 25 frames per second. It has 2500 - times geometric magnification (Diamond model) or 1800 - times (Ruby model), and a higher system magnification. Combined with digital zoom, the total magnification is considerable, for example, the Diamond model can reach 35,500 times. It can achieve a 70 ° oblique angle view, has a large inspection area, and the maximum sample size can reach 29”×22.8” (736×580 mm).