基恩士KEYENCE VK-X100series是一款激光扫描共聚焦显微镜。它能以0.5纳米的测量分辨率，实现最高28,800倍的显微观察。可对任何材料进行非接触式的轮廓、粗糙度及膜厚测量，还支持2D与3D测量、自动聚焦等功能，适用于材料分析、工业检测等多领域。 The KEYENCE VK - X100 series is a laser scanning confocal microscope. It can achieve microscopic observation at up to 28,800× magnification with a measuring resolution of 0.5 nanometers. It can perform non - contact profile, roughness, and film thickness measurements on any material, and also supports functions such as 2D and 3D measurements, auto - focus, etc. It is suitable for multiple fields like material analysis and industrial inspection.